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Springer, Journal of Materials Research, 10(24), p. 3044-3049, 2009

DOI: 10.1557/jmr.2009.0387

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Optical absorbance enhancement by electrochemical surface roughening of CuInS2 thin films

Journal article published in 2009 by Romain Cayzac, Florence Boulc'h, Virginie Hornebecq, Thierry Djenizian, Marc Bendahan, Marcel Pasquinelli ORCID, Philippe Knauth
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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Abstract

This work presents a simple electrochemical etching method to increase the surface roughness of copper indium disulphide (CIS) thin films using low concentration of hydrochloric acid. Film morphologies were investigated using scanning electron microscopy and atomic force microscopy. The structure of films was investigated using x-ray diffraction. A comparative study of optical properties of as-deposited and roughened CIS thin films by transmittance and reflectance experiments show a strong enhancement of absorbance for wavelengths between 600 and 900 nm.