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Inderscience, International Journal of Nanotechnology, 10/11/12(8), p. 935

DOI: 10.1504/ijnt.2011.044438

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Seeing inside materials by aberration-corrected electron microscopy

This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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