Published in
Institute of Electrical and Electronics Engineers, IEEE Transactions on Electron Devices, 8(62), p. 2606-2613, 2015
Links
Tools
A Complete Statistical Investigation of RTN in HfO<sub>2</sub>-Based RRAM in High Resistive State
Journal article published in 2015 by
Francesco Maria Puglisi,
Luca Larcher,
Andrea Padovani,
Paolo Pavan 
This paper was not found in any repository, but could be made available legally by the author.
Full text: Unavailable
Published version:
archiving forbidden
Data provided by 