Published in
Institute of Electrical and Electronics Engineers, IEEE Electron Device Letters, 3(36), p. 232-234, 2015
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Impact of Gate Metal on the Performance of p-GaN/AlGaN/GaN High Electron Mobility Transistors
Journal article published in 2015 by
Finella Lee,
Liang-Yu Su,
Chih-Hao Wang,
Yuh-Renn Wu 
,
Jianjang Huang
,
Jianjang Huang
This paper was not found in any repository, but could be made available legally by the author.
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