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Materials Research Society, Materials Research Society Symposium Proceedings, (1206), 2009

DOI: 10.1557/proc-1206-m11-39

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Determination of the wurtzite content and orientation distribution of nanowire ensembles

Journal article published in 2009 by Dominik Kriegner ORCID, Mario Keplinger, Julian Stangl, Aaron M. Andrews, Pavel Klang, Bernhard Mandl, Thomas Mårtensson, Magnus Borgstrom, Knut Deppert, Lars Samuelson, Gottfried Strasser, Güenther Bauer
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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Abstract

AbstractWe present x-ray diffraction based methods to quantitatively determine the wurtzite content of nanowire ensembles and to investigate the effect of twinning. An increased lattice constant in growth direction is found for all investigated InAs and InP nanowire samples. This increase is independent of the wurtzite content. Using x-ray pole figures we find that twinning is present in GaAs/Si branched nanowires, which leads to 60° rotations of the lattice.