AbstractThe microstructural features of diverse samples are studied by powder X-ray diffraction using different methods for the analysis of the diffraction peak broadening. The results obtained are thoroughly analyzed taking into account the assumptions and simplifications done in each of the chosen methods (Scherrer, Stokes and Wilson, Williamson-Hall and Rietveld refinement) and direct observation of the studied specimens by transmission electron microscopy is used in order to contrast the results obtained. Classic simple methods that consider only size effects (Scherrer, Stokes and Wilson) or the combined effects of size and strains (Williamson-Hall) provide a rapid overview of the origins of line-broadening but the most reliable results are obtained when the whole diffraction pattern is taken into account (Rietveld refinement).