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Published in

International Union of Crystallography, Journal of Synchrotron Radiation, 3(17), p. 299-307, 2010

DOI: 10.1107/s0909049510004644

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Coherence and wavefront characterization of Si-111 monochromators using double-grating interferometry

This paper is made freely available by the publisher.
This paper is made freely available by the publisher.

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