Published in

International Union of Crystallography, Journal of Synchrotron Radiation, 2(8), p. 437-439, 2001

DOI: 10.1107/s0909049500018367

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Quantitative analysis ofL-edge white line intensities: the influence of saturation and transverse coherence

This paper is made freely available by the publisher.
This paper is made freely available by the publisher.

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Abstract

We have performed x-ray absorption spectroscopy at the Fe, Ni, and Co L 2,3 edges of in situ grown thin magnetic films. We compare electron yield measurements performed at SSRL and BESSY-I. Differences in the L 2,3 white line intensities are found for all three elements, comparing data from the two facilities. We propose a correlation between spectral intensities and the degree of spatial coherence of the exciting radiation. The electron yield saturation effects are stronger for light with a higher degree of spatial coherence. Therefore the observed, coherence related, intensity variations are due to an increase in the absorption coefficient, and not to secondary channel related effects.