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IOP Publishing, Nanotechnology, 42(22), p. 425703

DOI: 10.1088/0957-4484/22/42/425703

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Atomic-scale nanoindentation: detection and identification of single glide events in three dimensions by force microscopy

Journal article published in 2011 by P. Egberts ORCID, R. Bennewitz
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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