Published in
IOP Publishing, Semiconductor Science and Technology, 5(15), p. 445-454, 2000
DOI: 10.1088/0268-1242/15/5/303
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Failure physics of ultra-thin SiO2gate oxides near their scaling limit
Journal article published in 2000 by
J. Suñé,
M. Nafría,
E. Miranda 
,
X. Oriols,
R. Rodríguez,
X. Aymerich
,
X. Oriols,
R. Rodríguez,
X. Aymerich
This paper was not found in any repository, but could be made available legally by the author.
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