Published in
Taylor and Francis Group, Radiation Effects and Defects in Solids, 1(132), p. 19-26
DOI: 10.1080/10420159408219252
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Random and channeled ion-damage distributions in Zn+implanted GaAs by electron microscopy
Journal article published in 1994 by
G. Vitali,
G. Consalvi,
M. Rossi,
C. Pizzuto,
G. Zollo 
,
M. Kalitzova
,
M. Kalitzova
This paper was not found in any repository, but could be made available legally by the author.
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