Published in
Institute of Electrical and Electronics Engineers, IEEE Transactions on Electron Devices, 5(60), p. 1745-1753, 2013
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Energy Distribution of Positive Charges in Gate Dielectric: Probing Technique and Impacts of Different Defects
Journal article published in 2013 by
Sharifah Wan Muhamad Hatta,
Zhigang Ji,
Jian Fu Zhang 
,
Meng Duan,
Wei Dong Zhang ,
Norhayati Soin,
Ben Kaczer,
Stefan De Gendt,
Guido Groeseneken
,
Meng Duan,
Wei Dong Zhang ,
Norhayati Soin,
Ben Kaczer,
Stefan De Gendt,
Guido Groeseneken
This paper was not found in any repository, but could be made available legally by the author.
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