Published in

Institute of Electrical and Electronics Engineers, IEEE Photonics Technology Letters, 19(25), p. 1939-1942, 2013

DOI: 10.1109/lpt.2013.2279545

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High-Sensitivity In-Band OSNR Monitoring System Integrated on a Silicon Photonics Chip

Journal article published in 2013 by Francesco Morichetti, Andrea Annoni, Marc Sorel, Andrea Melloni ORCID
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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Abstract

We report on a compact ( footprint) silicon photonics integrated system performing high-sensitivity monitoring of in-band optical signal-to-noise ratio (OSNR). The system, including a thermally tunable racetrack resonator filter and an unbalanced Mach-Zehnder interferometer, performs the autocorrelation measurement of a filtered fraction of the noisy signal spectrum. Monitor performance is evaluated on a 10 Gb/s ON/OFF keying nonreturn to zero signal, demonstrating an accuracy of 0.4 dB over a wide OSNR range from 8 to 28 dB. We also demonstrate that the proposed system induces a tiny distortion of the optical signal, making it suitable for in-line monitoring of signal quality.