Published in
2014 IEEE 2nd International Conference on Emerging Electronics (ICEE)
DOI: 10.1109/icemelec.2014.7151183
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Influence of gate and drain bias on the bias-stress stability of flexible organic thin-film transistors
Proceedings article published in 2014 by
Sibani Bisoyi,
Shree Prakash Tiwari 
,
Ute Zschieschang,
Hagen Klauk
,
Ute Zschieschang,
Hagen Klauk
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