Published in
International Union of Crystallography, Journal of Synchrotron Radiation, 1(21), p. 1-4, 2013
DOI: 10.1107/s1600577513023205
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- International Union of Crystallography
- ORCID
- [www.ncbi.nlm.nih.gov] | PDF
- [europepmc.org] | PDF
- [www.ncbi.nlm.nih.gov] | PDF
- [www.ncbi.nlm.nih.gov] | PDF
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Pinhole-type two-dimensional ultra-small-angle X-ray scattering on the micrometer scale
Journal article published in 2013 by
Hiroyuki Kishimoto,
Yuya Shinohara 
,
Yoshio Suzuki,
Akihisa Takeuchi,
Naoto Yagi,
Yoshiyuki Amemiya
,
Yoshio Suzuki,
Akihisa Takeuchi,
Naoto Yagi,
Yoshiyuki Amemiya
This paper is made freely available by the publisher.
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Abstract
A pinhole-type two-dimensional ultra-small-angle X-ray scattering set-up at a so-called medium-length beamline at SPring-8 is reported. A long sample-to-detector distance, 160.5 m, can be used at this beamline and a small-angle resolution of 0.25 µm−1was thereby achieved at an X-ray energy of 8 keV.