Published in
IOP Publishing, Journal of Physics: Conference Series, (186), p. 012060, 2009
DOI: 10.1088/1742-6596/186/1/012060
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Development of incident x-ray flux monitor for coherent x-ray diffraction microscopy
Journal article published in 2009 by
Yukio Takahashi 
,
Hideto Kubo,
Hayato Furukawa,
Kazuto Yamauchi,
Eiichiro Matsubara,
Tetsuya Ishikawa,
Yoshinori Nishino
,
Hideto Kubo,
Hayato Furukawa,
Kazuto Yamauchi,
Eiichiro Matsubara,
Tetsuya Ishikawa,
Yoshinori Nishino
This paper is made freely available by the publisher.
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