Published in
Wiley, Surface and Interface Analysis, 6(47), p. 719-722, 2015
DOI: 10.1002/sia.5768
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X-ray-induced degradation of OEG-terminated SAMs on silica surfaces during XPS characterization
Journal article published in 2015 by
Francisco Palazon,
Thomas Gehin,
Thomas Géhin,
Djawhar Ferrah 
,
Anaïs Garnier,
Claude Botella,
Geneviève Grenet,
Eliane Souteyrand,
J. Clerico,
Jean-Pierre Cloarec,
Yann Chevolot
,
Anaïs Garnier,
Claude Botella,
Geneviève Grenet,
Eliane Souteyrand,
J. Clerico,
Jean-Pierre Cloarec,
Yann Chevolot
This paper is made freely available by the publisher.
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