Published in

American Institute of Physics, Applied Physics Letters, 22(101), p. 223111

DOI: 10.1063/1.4769042

Links

Tools

Export citation

Search in Google Scholar

Universal scaling of resistivity in bilayer graphene

Journal article published in 2012 by Kalon Gopinadhan, Young Jun Shin, Hyunsoo Yang ORCID
This paper is available in a repository.
This paper is available in a repository.

Full text: Download

Green circle
Preprint: archiving allowed
Green circle
Postprint: archiving allowed
Orange circle
Published version: archiving restricted
Data provided by SHERPA/RoMEO

Abstract

We report the temperature dependent electrical transport properties of gated bilayer graphene devices. We see a clear evidence of insulating behavior due to electron-hole charge puddles. The electrical resistivity increases while the mobility decreases with decreasing temperature, a characteristic due to carrier inhomogeneity in graphene. The theoretical fittings using an empirical formula of single electron tunneling indicate that electrical resistivity follows a universal curve with a scaling parameter. The scaling parameter is determined to be a measure of the fluctuations in the electron-hole puddle distribution.