Published in
Elsevier, Applied Surface Science, (312), p. 81-86
DOI: 10.1016/j.apsusc.2014.05.086
Links
Tools
AFM imaging and fractal analysis of surface roughness of AlN epilayers on sapphire substrates
Journal article published in 2014 by
Dinara Dallaeva 
,
Ştefan Ţălu ,
Sebastian Stach ,
Pavel Škarvada,
Pavel Tománek,
Lubomír Grmela
,
Ştefan Ţălu ,
Sebastian Stach ,
Pavel Škarvada,
Pavel Tománek,
Lubomír Grmela
This paper was not found in any repository, but could be made available legally by the author.
Full text: Unavailable
Postprint:
archiving forbidden
Published version:
archiving forbidden
Data provided by 