Published in
Institute of Electrical Engineers of Japan, Denki Gakkai Ronbunshi. A, Kiso Zairyo Kyotsu Bumonshi / IEEJ Transactions on Fundamentals and Materials, 11(125), p. 902-907, 2005
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Measurement of Edge Localized Mode using Fast Camera in NSTX
Journal article published in 2005 by
Nobuhiro Nishino,
Lane Roquemore,
Theodore M. Biewer 
,
Stewart J. Zweben,
Ricardo Maqueda,
Rajesh Maingi,
Charles Bush,
Kevin Tritz,
Dan Stutman,
Nstx Team
,
Stewart J. Zweben,
Ricardo Maqueda,
Rajesh Maingi,
Charles Bush,
Kevin Tritz,
Dan Stutman,
Nstx Team
This paper is made freely available by the publisher.
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