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Elsevier, Thin Solid Films, 21(518), p. 5965-5970

DOI: 10.1016/j.tsf.2010.05.107

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Role of current profiles and atomic force microscope tips on local electric crystallization of amorphous silicon

Journal article published in 2010 by E. Verveniotis, B. Rezek ORCID, E. Šípek, J. Stuchlík, J. Kočka
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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