Published in
Elsevier, Solid-State Electronics, (116), p. 88-94, 2016
DOI: 10.1016/j.sse.2015.11.037
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Impact of gate dielectric constant variation on tunnel field-effect transistors (TFETs)
Journal article published in 2016 by
Seung Kyu Kim,
Woo Young Choi 
This paper was not found in any repository, but could be made available legally by the author.
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