Published in
Springer Verlag, Lecture Notes in Computer Science, p. 451-458
DOI: 10.1007/978-3-540-32256-6_39
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Automatic Distance Measurement and Material Characterization with Infrared Sensors
Proceedings article published in 2005 by
Miguel Angel Garcia,
D. Nardi,
M. Riedmiller,
Agusti Solanas 
,
C. Sammut,
J. SantosVictor
,
C. Sammut,
J. SantosVictor
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