Published in
Institute of Electrical and Electronics Engineers, IEEE Transactions on Microwave Theory and Techniques, p. 1-9, 2016
DOI: 10.1109/tmtt.2016.2523991
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On-Wafer Single-Pulse Thermal Load–Pull RF Characterization of Trapping Phenomena in AlGaN/GaN HEMTs
Journal article published in 2016 by
Agostino Benvegnu,
Sylvain Laurent,
Matteo Meneghini 
,
Denis Barataud,
Gaudenzio Meneghesso,
Enrico Zanoni,
Raymond Quere
,
Denis Barataud,
Gaudenzio Meneghesso,
Enrico Zanoni,
Raymond Quere
This paper was not found in any repository, but could be made available legally by the author.
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