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Wiley, physica status solidi (b) – basic solid state physics, 2(70), p. 577-590, 1975

DOI: 10.1002/pssb.2220700217

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The Critical Voltage Effect in Transmission Electron Microscopy IV. Influence of High-Order Systematic Reflections

Journal article published in 1975 by M. David ORCID, R. Gevers, R. Serneels
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

Full text: Unavailable

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