Published in
IOP Publishing, Nanotechnology, 10(27), p. 105706
DOI: 10.1088/0957-4484/27/10/105706
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Multifrequency spectrum analysis using fully digital G Mode-Kelvin probe force microscopy
Journal article published in 2016 by
Liam Collins,
Alex Belianinov 
,
Suhas Somnath,
Brian J. Rodriguez,
Nina Balke ,
Sergei V. Kalinin,
Stephen Jesse
,
Suhas Somnath,
Brian J. Rodriguez,
Nina Balke ,
Sergei V. Kalinin,
Stephen Jesse
This paper was not found in any repository, but could be made available legally by the author.
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