Published in
Journal of the Korean Institute of Electrical and Electronic Material Engineers, 12(27), p. 792-796
DOI: 10.4313/jkem.2014.27.12.792
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65 Nm CMOS 기술에서 소자 종류에 따른 신뢰성 특성 분석
Journal article published in 2014 by
Chang Su Kim,
Sung-Kyu Kwon,
Jae-Nam Yu,
Sun-Ho Oh,
Seong-Yong Jang,
Hi-Deok Lee
