Published in
Institute of Electrical and Electronics Engineers, IEEE Transactions on Device and Materials Reliability, 2(7), p. 333-339, 2007
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Postbreakdown Conduction in Ultrathin $\hbox{La}_{2} \hbox{O}_{3}$ Gate Dielectrics
Journal article published in 2007 by
Enrique Miranda 
,
Hiroshi Iwai
,
Hiroshi Iwai
This paper was not found in any repository, but could be made available legally by the author.
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