Published in

Institute of Electrical and Electronics Engineers, IEEE Transactions on Applied Superconductivity, 2(15), p. 3470-3473, 2005

DOI: 10.1109/tasc.2005.849061

Links

Tools

Export citation

Search in Google Scholar

Effects of Bending on Cracking and Critical Current of<tex>$rm Nb_3rm Sn$</tex>ITER Wires

Journal article published in 2005 by B. J. Senkowicz, M. Takayasu, P. J. Lee ORCID, J. V. Minervini ORCID, D. C. Larbalestier ORCID
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

Full text: Unavailable

Green circle
Preprint: archiving allowed
Upload
Green circle
Postprint: archiving allowed
Upload
Red circle
Published version: archiving forbidden
Policy details
Data provided by SHERPA/RoMEO