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Published in

Elsevier, Physica B: Condensed Matter, (259-261), p. 631-633

DOI: 10.1016/s0921-4526(98)01174-0

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Magnetic properties of UPd2Al3 thin films investigated by resonant magnetic X-ray scattering

This paper is available in a repository.
This paper is available in a repository.

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Data provided by SHERPA/RoMEO

Abstract

Thin films with thicknesses varying from 100 to 1600 Å of the magnetic heavy-fermion superconductor UPd2Al3 have been investigated by resonant magnetic X-ray scattering. All films studied show the same antiferromagnetic structure as the bulk material. The magnetic order seems to develop initially on the surface of the film and penetrates into the film on lowering the temperature. In the hexagonal c direction (film growth direction) the magnetic correlations extend over the complete film thickness at low temperature. The magnetic correlation lengths in the plane of the film are approximately equal to those along the c-axis.