Published in
Elsevier, Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, (136-138), p. 290-296
DOI: 10.1016/s0168-583x(97)00874-4
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Ion beam analysis and alpha spectrometry of sources electrodeposited on several backings
Journal article published in 1998 by
J. L. Ferrero Calabuig,
F. Vera Tomé,
A. Martín Sánchez,
C. Roldán García,
M. F. da Silva,
Da Silva,
J. C. Soares,
F. J. Ager 
,
D. Juanes Barber,
P. Rubio Montero
,
D. Juanes Barber,
P. Rubio Montero
This paper was not found in any repository, but could be made available legally by the author.
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