Published in
Elsevier, Thin Solid Films, 3(517), p. 1047-1052
DOI: 10.1016/j.tsf.2008.05.038
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Spectroscopic ellipsometry characterization of polymer–fullerene blend films
Journal article published in 2008 by
A. M. C. Ng 
,
K. Y. Cheung,
M. K. Fung,
A. B. Djurišić,
W. K. Chan
,
K. Y. Cheung,
M. K. Fung,
A. B. Djurišić,
W. K. Chan
This paper was not found in any repository, but could be made available legally by the author.
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