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Elsevier, Surface Science, 7(600), p. 1462-1467

DOI: 10.1016/j.susc.2006.01.039

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Hydrogen related point defects in silicon based layers: Si(·)H and SiOOH

Journal article published in 2006 by Vladislav Dřínek, Karel Vacek, Gleb Yuzhakov, Zdeněk Bastl ORCID, Sergej Naumov
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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