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Elsevier, Physica E: Low-dimensional Systems and Nanostructures, 1-2(38), p. 80-84

DOI: 10.1016/j.physe.2006.12.026

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Influence of the thickness of the tunnel layer on the charging characteristics of Si nanocrystals embedded in an ultra-thin SiO2 layer

This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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