Published in
Elsevier, Materials Science and Engineering: B, 1-3(152), p. 132-135
DOI: 10.1016/j.mseb.2008.06.022
Links
Tools
X-ray absorption fine structure study of In implanted GaN: Effect of annealing
Journal article published in 2008 by
M. Katsikini 
,
F. Pinakidou,
E. C. Paloura ,
F. Boscherini,
E. Wendler,
W. Wesch
,
F. Pinakidou,
E. C. Paloura ,
F. Boscherini,
E. Wendler,
W. Wesch
This paper was not found in any repository, but could be made available legally by the author.
Full text: Unavailable
Postprint:
archiving forbidden
Published version:
archiving forbidden
Data provided by 