Published in
Elsevier, Materials Science and Engineering: B, (114-115), p. 184-192, 2004
DOI: 10.1016/j.mseb.2004.07.054
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Modeling of extrinsic extended defect evolution in ion-implanted silicon upon thermal annealing
Journal article published in 2004 by
C. J. Ortiz,
F. Cristiano,
B. Colombeau,
A. Claverie,
N. E. B. Cowern
This paper was not found in any repository, but could be made available legally by the author.
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