Published in

Elsevier, Microelectronics Reliability

DOI: 10.1016/j.microrel.2015.12.022

Links

Tools

Export citation

Search in Google Scholar

Modern IGBT gate driving methods for enhancing reliability of high-power converters — An overview

This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

Full text: Unavailable

Green circle
Preprint: archiving allowed
Red circle
Postprint: archiving forbidden
Red circle
Published version: archiving forbidden
Data provided by SHERPA/RoMEO