Published in
Elsevier, Microelectronics Reliability, 8-9(48), p. 1604-1607, 2008
DOI: 10.1016/j.microrel.2008.06.007
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Compact modeling of the non-linear post-breakdown current in thin gate oxides using the generalized diode equation
Journal article published in 2008 by
E. Miranda 
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