Published in
Elsevier, Journal of Alloys and Compounds, 1-2(382), p. 107-111
DOI: 10.1016/j.jallcom.2004.05.041
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Synchrotron X-ray wavelength calibration using a diamond internal standard: application to low-temperature thermal-expansion studies
Journal article published in 2004 by
W. Paszkowicz 
,
M. Knapp,
C. Baehtz,
R. Minikayev,
P. Piszora,
J. Z. Jiang,
R. Bacewicz
,
M. Knapp,
C. Baehtz,
R. Minikayev,
P. Piszora,
J. Z. Jiang,
R. Bacewicz
This paper was not found in any repository, but could be made available legally by the author.
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