Published in
Elsevier, Applied Surface Science, 3-4(242), p. 375-379
DOI: 10.1016/j.apsusc.2004.09.002
Links
Tools
Ion bombardment induced interface broadening in Co/Cu system as a function of layer thickness
This paper was not found in any repository, but could be made available legally by the author.
Full text: Unavailable
Postprint:
archiving forbidden
Published version:
archiving forbidden
Data provided by 