Characterization of in-plane structures of vapor deposited thin-films of distyryl-oligothiophenes by grazing incidence x-ray diffractometry
Journal article published in 2007 by
Noriyuki Yoshimoto,
Keijyu Aosawa,
Toshinori Taniswa,
Kazuhiko Omote,
J. Ackermann,
C. Videlot-Ackermann 
,
H. Brisset ,
F. Fages
,
H. Brisset ,
F. Fages
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