Published in
American Institute of Physics, Journal of Vacuum Science and Technology B, 3(19), p. 818
DOI: 10.1116/1.1364697
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Quantitative analysis of the bit size dependence on the pulse width and pulse voltage in ferroelectric memory devices using atomic force microscopy
Journal article published in 2001 by
Jungwon Woo,
Seungbum Hong 
,
Nava Setter,
Hyunjung Shin,
Jong-Up Jeon,
Y. Eugene Pak,
Kwangsoo No
,
Nava Setter,
Hyunjung Shin,
Jong-Up Jeon,
Y. Eugene Pak,
Kwangsoo No
This paper was not found in any repository, but could be made available legally by the author.
Full text: Unavailable
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