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Published in

Taylor and Francis Group, International Journal of Polymer Analysis and Characterization, 7(19), p. 648-660

DOI: 10.1080/1023666x.2014.953749

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Micromorphology Characterization of SiO2-Based Composite Thin Films with Immobilized Terbium(III) Complex

This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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