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Optica, Optics Letters, 17(36), p. 3386, 2011

DOI: 10.1364/ol.36.003386

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Phase characterization of the reflection on an extreme UV multilayer: comparison between attosecond metrology and standing wave measurements

This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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