Published in
American Institute of Physics, APL Materials, 2(2), p. 022109
DOI: 10.1063/1.4866051
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Focused-ion-beam induced damage in thin films of complex oxide BiFeO3
Journal article published in 2014 by
W. Siemons,
C. Beekman,
J. D. Fowlkes,
N. Balke 
,
J. Z. Tischler,
R. Xu,
W. Liu,
C. M. Gonzales,
J. D. Budai,
H. M. Christen
,
J. Z. Tischler,
R. Xu,
W. Liu,
C. M. Gonzales,
J. D. Budai,
H. M. Christen
This paper is made freely available by the publisher.
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