Published in
American Institute of Physics, Journal of Applied Physics, 4(115), p. 043526
DOI: 10.1063/1.4863778
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Microstructure of highly strained BiFeO3 thin films: Transmission electron microscopy and electron-energy loss spectroscopy studies
Journal article published in 2014 by
Young Heon Kim,
Akash Bhatnagar,
Eckhard Pippel,
Marin Alexe 
,
Dietrich Hesse
,
Dietrich Hesse
This paper was not found in any repository, but could be made available legally by the author.
Full text: Unavailable
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