Published in
American Institute of Physics, Applied Physics Letters, 23(103), p. 232906
DOI: 10.1063/1.4839276
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Quantifying thickness-dependent charge mediated magnetoelectric coupling in magnetic/dielectric thin film heterostructures
Journal article published in 2013 by
Z. Zhou,
T. X. Nan,
Y. Gao,
X. Yang,
S. Beguhn,
M. Li,
Y. Lu,
J. L. Wang 
,
M. Liu ,
K. Mahalingam,
B. M. Howe,
G. J. Brown,
N. X. Sun
,
M. Liu ,
K. Mahalingam,
B. M. Howe,
G. J. Brown,
N. X. Sun
This paper was not found in any repository, but could be made available legally by the author.
Full text: Unavailable
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