Published in
American Institute of Physics, Journal of Applied Physics, 13(114), p. 133703
DOI: 10.1063/1.4823985
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Simulation of electrical conduction in thin polycrystalline metallic films: Impact of microstructure
Journal article published in 2013 by
J. M. Rickman,
K. Barmak 
This paper was not found in any repository, but could be made available legally by the author.
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