We have used the ratio of the integrated intensity of graphene's Raman G peak to that of the silicon substrate's first-order optical phonon peak, accurately to determine the number of graphene layers across our molecular-beam (MB) grown graphene films. We find that these results agree well both, with those from our own exfoliated single and few-layer graphene flakes, and with the results of Koh [ACS Nano 5, 269 (2011)]. We hence distinguish regions of single-, bi-, tri-, four-layer, etc., graphene, consecutively, as we scan coarsely across our MB-grown graphene. This is the first, but crucial, step to being able to grow, by such molecular-beam-techniques, a specified number of large-area graphene layers, to order. © 2013 AIP Publishing LLC. ; Work supported by ONR (N000140610138 and Graphene Muri), EFRC Center for Re-Defining Photovoltaic Efficiency through Molecule Scale Control (award DE-SC0001085), NSF (CHE-0641523), NYSTAR, CSIC-PIF (200950I154), Spanish CAM (Q&C Light (S2009ESP-1503), Numancia 2 (S2009/ENE-1477)), and Spanish MEC (ENE2009-14481-C02-02, TEC2011-29120-C05-04, MAT2011-26534). ; S2009/ESP-1503/Q&CLight ; S2009/ENE-1477/Numancia2 ; Peer Reviewed