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American Institute of Physics, Applied Physics Letters, 9(102), p. 094102

DOI: 10.1063/1.4794063

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High-resolution and high-sensitivity phase-contrast imaging by focused hard x-ray ptychography with a spatial filter

Journal article published in 2013 by Yukio Takahashi ORCID, Akihiro Suzuki, Shin Furutaku, Kazuto Yamauchi, Yoshiki Kohmura, Tetsuya Ishikawa
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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Abstract

We demonstrate high-resolution and high-sensitivity x-ray phase-contrast imaging of a weakly scattering extended object by scanning coherent diffractive imaging, i.e., ptychography, using a focused x-ray beam with a spatial filter. We develop the x-ray illumination optics installed with the spatial filter to collect coherent diffraction patterns with a high signal-to-noise ratio. We quantitatively visualize the object with a slight phase shift (∼λ/320) at spatial resolution better than 17 nm in a field of view larger than ∼2×2μm2. The present coherent method has a marked potential for high-resolution and wide-field-of-view observation of weakly scattering objects such as biological soft tissues.